The new models, for 6, 10 or 25A nominal measurements of dc, ac, and pulsed signals benefit from the revised LEM Open-loop Hall-effect ASIC (Application Specific Integrated Circuit) introduced several months ago with the launch of the HO 8, 15 and 25-NP and –NSM models.
Using the latest LEM-developed ASIC, combined with open-loop Hall-effect technology, the new devices meet the demand for high performance and quality at a lower cost.
The HO 6, 10 and 25-P models’ offset and gain drift are twice as accurate (over the temperature range -25 to +85ºC) as the previous generation. A high level of insulation between primary and measurement circuits, due to the high clearance and creepage distances of more than 8mm and a CTI (comparative tracking index) of 600, allows a test isolation voltage of 4.3 kVrms/50Hz/one minute.
In addition, the HO xx-P series delivers better performance in other areas such as response time, power supply and noise, allowing the development of more technically advanced power electronics applications.
The transducers require a PCB mounting area of only 2.88cm2 and weigh only 10g. They can measure up to 2.5 times the primary nominal current but also incorporate an additional pin providing an over-current detection set at 2.63 x the nominal current IPN (peak value). The products also provide fault reporting in the case of memory contents being corrupted. LEM's HO xx-P transducers operate from a single supply voltage at 3.3 or 5V.
The new range delivers its output as a scaled analogue voltage; in most systems this will be converted to a digital value by an analogue/digital converter (ADC) which requires a reference voltage. The HO xx-P series can also be configured to make measurements relative to an external reference.