Feature

I/O module for digital and analogue test & measurement

JTAG Technologies has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analogue/Frequency) measurement module, offering both digital and analogue test access to PCBs via JTAG Technologies’ QuadPod signal conditioning interface. When connected to a circuit board via edge connector or test fixture/jig test pins the module enhances standard digital boundary-scan tests by enabling a series of analogue and frequency measurements to be made.

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Capabilities of the module include 16 dual-purpose digital pins capable of digital I/O stimulus and response at voltages of 1.0 to 3.6V plus frequency measurements of up to 128MHz on any pin. 12 additional analogue measurement channels can capture values from 0 to 33V with better than 10mV resolution. One further channel is available as a clock generator, programmable up to 64MHz.

Test engineers often wish to check circuit fundamentals, such as voltage rails and clock frequencies, before undertaking more stringent boundary-scan based structural and functional tests. The JT 2149/DAF is perfect for this application and helps the system builder who might ordinarily use an extra piece of test equipment.

The JT 2149/DAF can be controlled through an interactive panel (virtual instrument) within JTAG ProVision as well as through Python scripts. A full Python API is included as part of JTAG Technologies current ProVision releases.

Written By Sophia Bell

Sophia Bell is the Group Editor of DPA, Connectivity, and PBSI. She joined the team in 2020 as Assistant Editor after achieving a First-Class Honours BA in English Literature and Film Studies from the University of East Anglia. In her current role, she leads the editorial strategy, driving digital growth and ensuring each title continues to deliver trusted, relevant insight for engineering and manufacturing professionals.