As the global economic climate places additional constraints on budgets, test engineers are challenged to identify ways to test devices more efficiently than ever before. National Instruments has identified three trends - software-defined instrumentation, parallel processing technologies, and new methods for wireless and semiconductor test - that will significantly improve the efficiency of test and measurement systems in 2009. These trends help engineers develop faster and more flexible automated test systems, whilst reducing their overall cost of test, and companies worldwide, and from all industries, are seeing significant benefits from applying these methods and technologies.
Learn about the top trends in test and measurement for 2009 at ni.com/automatedtest