Ensuring electronic devices’ reliability through non-destructive testing of speciality materials

Manufacturers of high-end semiconductor electronic products used in consumer, industrial and military applications have long relied on precise testing methodologies to identify the location of defects, such as voids and cracks, and the delamination of different layers within a microelectronic device, also known as a chip.

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Scanning acoustic microscopy (SAM), a non-invasive and non-destructive ultrasonic testing method, has become an industry standard to detect and analyse flaws during various chip production steps and in the final quality inspection
after packaging. 

In addition, SAM is often utilised to identify a specific root-cause failure mechanism when a device fails during use.

Today's electronics products contain various speciality metals, alloys, plastics, and glass components.
All semiconductor components need to be enclosed and packaged in consumer-usable form factors. As a result, SAM equipment has evolved and is now being used to detect subsurface flaws, dis-bonds, cracks, and
other irregularities in these types of materials that constitute “packaging” of semiconductor components.

With the same rigour of failure analysis and quality testing used for semiconductors now being applied to metals and alloys,
both the production yield and overall reliability of electronic devices have improved significantly. Projects are completed in less time, while eliminating potential points of failure in the field. 


Read the full article in the April issue of DPA


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